The name is absent

XV

5.8 (a) Locations of defects on SLM 1 observed under the microscope (see
lines sketched on mask), (b) An 32×32 image of the modulation
depth of the pixels on SLM 1, overlaid with sketches of defects in (a).
At 0.37 THz, the SLM provides around 20% amplitude modulation at
the darker regions on the image, and has zero modulation at the
brighter regions. The defects cut off some SLM pixels from their
Schottky pads, thus the SLM cannot provide any amplitude
modulation at the corresponding pixel locations............ 53

5.9 Microscope images of defect locations on SLM 1 indicated on

Figure 5.8(a). Location 1 has a crack whereas location 2 and 3 have
fabrication defects............................. 54

5.10 (a) Locations of defects on SLM 2 observed under the microscope (see
lines sketched on mask), (b) An 32×32 image of the modulation
depth of the pixels on SLM 2, overlaid with sketches of defects in (a).
At 0.37 THz, the SLM provides around 20% amplitude modulation at
the darker regions on the image, and has zero modulation at the
brighter regions. The defects cut off some SLM pixels from their
Schottky pads, thus the SLM cannot provide any amplitude
modulation at the corresponding pixel locations............ 54

5.11 Microscope images of defect locations on SLM 2 indicated on

Figure 5.10(a). A continuous crack runs through location 1 and 2 on
SLM 2.................................... 55

6.1 Comparison of CS imaging systems with raster-scan and detector
array systems. Assuming system implementation with a
continuous-wave THz source, the single-pixel imaging system can
provide high-speed imaging at room temperature with a reasonable
hardware requirement........................... 61

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