exact value of the leakage current involves elaborate expressions. Since such an
exact leakage model does not affect our basic approach, we use following model
presented (n [60].
ʃɪeak = qie^L+^L2\ (3.1)
Ileak is the leakage current of a transistor; q1, q2, and ⅛ are three constants
that are determined by physical characteristic of the transistor and L is the
gate length of the transistor, q3 is a small number and q3L2 ≪ q2L [60]. This
model suggests an exponential relation between the transistor gate length and
the leakage power. Thus, the leakage current approximately has a log-normal
distribution and pu = φup‰ where pɑ and pu are nominal power and real power
of the gate, respectively, and φu = e^“ ; where ≠u represent variation in transistor
dimension.
Thus, given a combinational circuit C consisting of N logical gates, Pj input
pins, and Pq output pins, each gate gu, based on its inputs signals b, consumes a
specific power pguj>∙ Because of the process variation, power consumption of gate
gu does not equal to its nominal power consumption pθuιj,. Rather, it is scaled by
Φu∙
Pgu,b = Pgu,bΦu
The scaling factors of gates, φu, need to be estimated, whenever it is feasible.
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