Figure 3.3: Number of independent measurement vectors for single voltage measure-
ments and multiple voltages (3 voltages) measurements. Multiple voltage
measurements increase number of independent rows in the measurement
matrix.
Figure 3.3 shows the number of the independent power vectors in the C432 cir-
cuit from ISCAS’85 benchmarks. Similar to the previous section, this experiment
is based on the 65nm CMOS transistor technology. In this figure, the number
of independent power vectors versus the number of random measurements are
shown. Two cases were investigated: measurement under single supply voltage
and measurement under three supply voltages. It is clear that for the same to-
tal number of measurements, three supply voltages measurements result in more
independent power vectors.
29
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